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BEGIN:VEVENT
SUMMARY:Security Testing of Complex Systems with Two Sides of Inputs
DTSTART:20220620T160000
DTEND:20220620T180000
DTSTAMP:20260407T021123Z
UID:27a74afef4f6b0b539540c572aa3aa8404e39c09a0ccfff3d7b6c708
CATEGORIES:Conferences - Seminars
DESCRIPTION:Zhiyao Feng\nEDIC candidacy exam\nExam president: Prof. James 
 Larus\nThesis advisor: Prof. Mathias Payer\nCo-examiner: Prof. Jean-Pierre
  Hubaux\n\nAbstract\n\nBackground papers\n\n	Fuzzing File Systems via Two-
 Dimensional Input Space Exploration\, https://ieeexplore.ieee.org/stamp/s
 tamp.jsp?tp=&arnumber=8835267&tag=1\n	Evaluating File System Reliability o
 n Solid State Drives\, https://www.usenix.org/system/files/atc19-jaffer.p
 df\n	MOPT: Optimized Mutation Scheduling for Fuzzers\, https://www.usenix
 .org/system/files/sec19-lyu.pdf\n
LOCATION:BC 133 https://plan.epfl.ch/?room==BC%20133
STATUS:CONFIRMED
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