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SUMMARY:X-ray characterization of materials (cam-X): Zooming into hierarch
 ical materials
DTSTART:20220926T170000
DTEND:20220926T174500
DTSTAMP:20260429T115513Z
UID:dd26ea58236309387e2f1ef3e678d8a5d4cb3dfdae90b754e0bef0e4
CATEGORIES:Inaugural lectures - Honorary Lecture
DESCRIPTION:Prof. Marianne Liebi\nInvestigating the underlying structure o
 f material in order to understand\, predict and improve its properties is 
 a central element of material science research. The relevant length scales
  can span from many meters down to the molecular organization at the Ångs
 tröm level\, thus making characterization tools capable of surmounting mu
 ltiple length scales important.  X-ray based techniques offer great benef
 its due to combining high penetration depths with information on the struc
 tural arrangement through their interaction with  materials down to the n
 anoscale. One example is small- and wide-angle X-ray scattering (SAXS/WAXS
 ) which can be combined with focused synchrotron radiation turning it into
  an imaging method\, providing information on the building blocks over mac
 roscopic length scales\, such as millimeter or centimeters. One key compon
 ent of our research is to investigate materials where alignment of the bui
 lding units confers anisotropic properties to the materials. Combining X-r
 ay scattering with computed-tomography while extracting local three-dimens
 ional orientation information allows to study the arrangement in complex m
 atter. A well suited example from biology  is bone tissue\, where the min
 eralized collagen fibers are arranged in a way to optimize the structural 
 support with efficient material usage. Synthetic materials can also exhibi
 t anisotropic material properties\, if for example polymer chains are alig
 ned within the processing steps. In-situ measurements allow to deepen our 
 understanding of the processing step in order to obtain an improved contro
 l over the manufacturing process and thereby tailored materials properties
 .\nBio: Marianne Liebi is Tenure-Track Assistant Professor at EPF Lausanne
 \, heading the Laboratory for X-ray characterization of materials (cam-X)
  and Group Leader at the Paul Scherrer Institute (PSI). She has been appoi
 nted in 2021 at EPFL where she is part of the Institute of Materials withi
 n the School of Engineering. Marianne Liebi studied Food Science at ETH Zu
 rich where she also obtained her PhD in 2013. As a Postdoc in the coherent
  X-ray scattering group at the Swiss Light Source she worked from 2013-201
 6 on method development in SAXS tensor tomography. In 2016 she moved to Sw
 eden where after a short period at the NanoMAX beamline\, MAXIV Laboratory
 \, Lund she started her own research group in 2017 as Assistant Professor 
 at the Chalmers University of Technology\, Gothenburg\, and became Docent 
 in Physics in spring 2020. She kept her affiliation at Chalmers University
  of Technology\, where still part of her group is located when moving back
  to Switzerland in 2020 where she was Scientific Group Leader in the Cente
 r for X-ray Analytics at Empa\, St.Gallen\, before joining PSI and EPFL in
  November 2021.\n\n\n 
LOCATION:CM 11 https://plan.epfl.ch/?room=%3DCM%201%201&dim_floor=1&lang=f
 r&dim_lang=fr&tree_groups=centres_nevralgiques%2Cacces%2Cmobilite_reduite%
 2Censeignement%2Ccommerces_et_services%2Cvehicules%2Cinfrastructure https:
 //epfl.zoom.us/j/62467080786
STATUS:CONFIRMED
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