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SUMMARY:What is my measurement equipment actually doing? Implication for 5
 G/6G\, mm-wave and related applications
DTSTART:20220922T170000
DTEND:20220922T180000
DTSTAMP:20260916T053150Z
UID:7322fd20c725200d695a4d2b7e96f99a7175e12cfb0eb528ad28a54e
CATEGORIES:Conferences - Seminars
DESCRIPTION:Dr. Jon Martens\, Anritsu\, USA\nCurrent microwave and high f
 requency instrumentation perform many tasks behind the scenes\, even more 
 so in the mm-wave and high modulation rate regimes\, and it is easy to los
 e track of how the equipment\, the processing algorithms\, the setup and t
 he signals are interacting.  By exploring the measurement mechanics withi
 n some common instruments under practical conditions\, it may be easier to
  understand where sensitivities or anomalies might increase and how to mit
 igate them.   Through a study of example architectures and measurements\
 , including those in the 100+ GHz range and those with wide modulation ban
 dwidths where linearity\, dynamic range and other physical metrics are str
 essed even more\, mechanisms and ideas for better measurements will be exp
 lored.\n\nhttps://ieeemeetings.webex.com/ieeemeetings/j.php?MTID=m054573f9
 8124410ef9140c96e7d4a7ee\n\nMeeting number:    2532 735 8258\nMeeting p
 assword:    biVR47EFgX5\n\nBiography: Jon Martens (M’91 – S’10) r
 eceived the BSEE\, MSEE and Ph.D. in Electrical Engineering from the Unive
 rsity of Wisconsin in 1986\, 1988 and 1990\, respectively. Since 1995\, he
  has been with Anritsu where he is currently an Engineering Fellow. His re
 search interests include measurement system architectures\, millimeter-wav
 e circuit and system design\, and a wide range of microwave measurement pr
 ocesses to include materials analysis\, nonlinear and quasi-linear charact
 erization\, optical interactions and calibration. He is the inventor or co
 -inventor on over 17 patents\, has (co-)authored several book chapters and
  over 50 technical publications. Dr. Martens is a past chair of the MTT me
 asurements technical subcommittee and is a past president of the measureme
 nts society ARFTG and is still active in both. He is a member of the techn
 ical program subcommittees for the International Microwave Symposium and A
 RFTG and is a former associate editor for the Transactions on Microwave Th
 eory and Techniques.
LOCATION:https://ieeemeetings.webex.com/ieeemeetings/j.php?MTID=m054573f98
 124410ef9140c96e7d4a7ee
STATUS:CONFIRMED
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