BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//Memento EPFL//
BEGIN:VEVENT
SUMMARY:Atom Probe Tomography for Materials Science
DTSTART:20230207T110000
DTEND:20230207T113000
DTSTAMP:20260407T003016Z
UID:7c6025e7b025f6acca9164d828f3ada4ec7b3b95d56f50779b59148e
CATEGORIES:Conferences - Seminars
DESCRIPTION:Dr. Stephan Gerstl\, ScopeM-ETH Zürich\nThe understanding of 
 our surroundings has often been limited by the instruments with which we c
 an measure things. Over time\, humanity has vastly improved the skills of 
 controlling beams of the smallest particles - be it photons\, electrons\, 
 or ions - to increasingly zoom into and measure the objects that surround 
 us. Atom probe tomography\, having no strict beams\, nonetheless results w
 ith million times magnifications and spatially resolves isotopes within ma
 terials in 3-dimensions. I will show how the technique\, and its progenito
 r Field Ion Microscopy\, achieves this feat and discuss its application to
  measuring various types of materials including metal alloys and glasses\,
  semiconductors\, and minerals. Methods to measure more dynamic (or softer
 ) materials will also be discussed\, along with conferring the benefits an
 d limitations of the characterization technique.
LOCATION:BC 420 https://plan.epfl.ch/?room==BC%20420
STATUS:CONFIRMED
END:VEVENT
END:VCALENDAR