BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//Memento EPFL//
BEGIN:VEVENT
SUMMARY:Advanced X-Ray Diffraction Methods for Coatings: Strain\, Defects 
 and Deformation Analysis of Thin Films
DTSTART;VALUE=DATE:20231122
DTSTAMP:20260405T153834Z
UID:2c870529aa93c540580524359751d4db1d65e19622737b0c8f2c467f
CATEGORIES:Conferences - Seminars
DESCRIPTION:Prof. Dr. Alex Domman\, Prof. Dr. Antonia Neels\, Dr. Aurelio 
 Borzì\nToday\, coatings are used in many applications for decorative or /
  and functional purposes. In functional coatings\, the surface properties 
 of the substrates such as adhesion\, corrosion or wear resistance can be c
 hanged. In semiconductor device fabrication\, the coating adds completely 
 new properties such as electrical conductivity\, magnetic or optical respo
 nses. This course uses X-ray Diffraction techniques (XRD) to investigate t
 he structural properties of coatings obtained by different deposition meth
 ods.
LOCATION:
STATUS:CONFIRMED
END:VEVENT
END:VCALENDAR