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PRODID:-//Memento EPFL//
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SUMMARY:Course: Introduction to scanning electron microscopy microanalysis
  techniques
DTSTART:20231129T080000
DTEND:20231201T170000
DTSTAMP:20260502T223251Z
UID:c62442cf0e81539047723f6f16ce2ca4511d0946e0201a5c4351c855
CATEGORIES:Conferences - Seminars
DESCRIPTION:Dr. Xavier Maeder\nProf. Johann Michler\nModern Scanning Elect
 ron Microscopes\, when combined with focused ion beams (Dual beam FIBs)\, 
 provide a larger number of multi-modal imaging and different analytical me
 thods. The course format consists of introductory lectures\, lectures on a
 dvanced techniques and practical work. This course may be validated for 1 
 ECTS credit in the doctoral programs of EPFL and ETH Zurich\, after accept
 ance by the corresponding institution. In this case\, students will need t
 o attend every lecture and pass a final written examination.\n\nTopics\n\n
 	Basics of the scanning electron microscopy and focused ion beam instrumen
 ts (construction principles\, signals\, interaction with the sample)\n	Adv
 anced imaging modes: STEM\, low tension microscopy\, high vacuum\, ion cha
 nneling\n	Advanced microstructure investigation with EBSD and transmission
  EBSD orientation mapping (EBSD strain and stress analyses with cross corr
 elation technique)\n	Chemical analyses with EDS\, WDS and μ-XRF\n	Chemica
 l depth profile with FIB-TOF-SIMS\n	Raman spectrometry for phase and strai
 n/stress analyses\n
LOCATION:
STATUS:CONFIRMED
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