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VERSION:2.0
PRODID:-//Memento EPFL//
BEGIN:VEVENT
SUMMARY:Atomic-scale Characterization of Strain and Gate effects on Two-di
 mensional Materials by Scanning Tunneling Microscopy
DTSTART:20230911T164500
DTSTAMP:20260508T213327Z
UID:92e693be8a340397bb21ddcc7bd7e5b10fc1e723e15c2ef00a8477d3
CATEGORIES:Thesis defenses
DESCRIPTION:Jz -Yuan JUO\nThesis Director: Prof. K. Kern\,\nPhysics doctor
 al program\nThesis Nr. 10592\n\nTo take part in the public defense\, plea
 se contact directly the speaker
LOCATION:Max Planck Institute\, Lecture Hall 2D5\, Heisenbergstr. 1.\, D-7
 0569 Stuttgart https://eu02web.zoom.us/j/64774694673?pwd=SW1Ja3l3STJXT3BJc
 1pVU25tTjZTQT09
STATUS:CONFIRMED
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