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SUMMARY:Advances in X-ray Energy Dispersive Spectroscopy in the Modern Ana
 lytical Electron Microscope
DTSTART:20230831T160000
DTEND:20230831T170000
DTSTAMP:20260920T161034Z
UID:0ed1fc55a5e2f4282f5ecdc5fff7b2ac56f40cb83b9e413f42e3f74e
CATEGORIES:Conferences - Seminars
DESCRIPTION:Nestor J. Zaluzec\, Argonne National Laboratory and Universit
 y of Chicago\nThe use (and abuse) of computationally mediated imaging and 
 diffraction experiments at the\nnano-to-pico scale continues to increase i
 n modern electron optical instruments. This is\nparticularly relevant in t
 he latest generation of aberration corrected electron optical instruments\
 nwhere advanced configurations are pushing the limits of what we in the pa
 st only dreamed of\nroutinely accomplishing. However\, at the same time\, 
 only incremental advances have been\ndone to augment/improve our analytica
 l capabilities. Spectroscopically\, the most common\nsignals are derived f
 rom inelastic scattering creating either electrons (EELS)\, photons (CL) o
 r\nx-rays (XEDS). Each of these three have their own merits and they all c
 omplement each other\noccasionally having overlapping in functionality. Re
 gardless of which of these three\nmeasurements are chosen\, the sensitivit
 y of each is directly tied to the ability to detect a\ncharacteristic sign
 al above some continuum background from which a quantitative measurement\n
 can be realized. Since 2004\, Argonne has been working on designs and impl
 ementations of\nlinear arrays of Silicon Drift Detectors (SDD's) for x-ray
  energy dispersive spectroscopy (XEDS)\nin the Analytical Electron Microsc
 ope (AEM). The goal to maximize the solid angle\, sensitivity\nas well as 
 mitigate artifacts. Evolving our original π steradian detector solution [
 1] and\ncollaborating with ThermoFisher Scientific [2]\, we have developed
  the X-ray Perimeter Array\nDetector (XPAD) which when combined with a cus
 tom electron optical pole piece (ZTwin) has\nimproved the detector perform
 ance to a record collection angle of 4.5 sR. This magnitude of\nthis impro
 vement is illustrated in Figure 1 which plots the evolution of the experim
 entally\nmeasured solid angle of detectors on Analytical TEM/STEM instrume
 nts over the last 40 years.
LOCATION:https://epfl.zoom.us/j/61998196334
STATUS:CONFIRMED
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