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VERSION:2.0
PRODID:-//Memento EPFL//
BEGIN:VEVENT
SUMMARY:Study of growth-induced point defects and their impact on InGaN-ba
 sed optoelectronic devices
DTSTART:20240531T170000
DTSTAMP:20260417T152618Z
UID:7db9e71e9f5c8788ac7af623a3c3312de29611555408f9cc9104a84f
CATEGORIES:Thesis defenses
DESCRIPTION:Yao CHEN\nThesis Director: Prof. N. Grandjean\,\nPhotonics doc
 toral program\nThesis Nr. 10259\n\nTo take part in the public defense\, p
 lease contact directly the speaker
LOCATION:CE 1 5 https://plan.epfl.ch/?room==CE%201%205 https://epfl.zoom.u
 s/j/66943596907
STATUS:CONFIRMED
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