BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//Memento EPFL//
BEGIN:VEVENT
SUMMARY:Advanced STEM EBIC Imaging of Operating Electronic Devices
DTSTART:20241127T170000
DTEND:20241127T180000
DTSTAMP:20261020T012132Z
UID:89c62d5daeabbedae03a4af362923f21c957470c037000aec67b3710
CATEGORIES:Conferences - Seminars
DESCRIPTION:Dr. William A. Hubbard | CEO of NanoElectronic Imaging\, Inc
 .\nTransmission electron microscopy (TEM) excels at determining the physic
 al structure and composition of samples down to the atomic scale. But devi
 ce operation often involves electronic changes that do not coincide with a
 ny significant physical changes (e.g.\, gate biasing\, driving a current\,
  or storing charge). As a result\, the processes underlying function and f
 ailure in electronic devices are often difficult\, if not impossible\, to 
 detect in TEM. Scanning TEM electron beam-induced current (STEM EBIC) imag
 ing provides high-resolution electronic contrast as a complement to TEM'
 s physical contrast. EBIC\, generally\, involves the measurement of curren
 t generated in a sample as it is scanned with an electron beam. It has bee
 n used to map electric fields in devices since the 1960’s and is typical
 ly performed in the scanning electron microscope (SEM). Recent advances in
  measurement sensitivity and sample preparation have rejuvenated the field
  of STEM EBIC\, leading to the demonstration of new EBIC modes\, atomic re
 solution EBIC\, and operando STEM EBIC. In this presentation we will dis
 cuss different modes of current generation\, compare SEM and STEM EBIC\, a
 nd demonstrate STEM EBIC mapping of various electronic properties\, includ
 ing conductivity. We will then present examples of advanced STEM EBIC char
 acterization of operating electronic devices ranging from modern commercia
 l semiconductor components to next-generation memory systems. \n\nBio:\nW
 illiam A. Hubbard received a BS in physics and mathematics from Boston Uni
 versity in 2008\, after which he worked as a research assistant in the Har
 vard University Physics Department until 2010. He received his PhD in expe
 rimental condensed matter physics in 2017 from UCLA\, where he was then a 
 postdoctoral scholar until 2019. From 2018 to 2021 he also held a casual a
 ppointment as a member of the technical staff at the Aerospace Corporation
 . Since 2020 he has been the CEO of NanoElectronic Imaging Inc. (NEI)\, wh
 ere his research focuses on developing electron-microscopy based technique
 s\, such as STEM EBIC\, that can visualize electronic and thermal contrast
  in operating nanodevices.\n 
LOCATION:https://epfl.zoom.us/j/61800515930
STATUS:CONFIRMED
END:VEVENT
END:VCALENDAR