BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//Memento EPFL//
BEGIN:VEVENT
SUMMARY:IMX Colloquium - Morphological Stability of Thin Films and Micro/N
 ano-Structures
DTSTART:20250414T131500
DTEND:20250414T141500
DTSTAMP:20260921T194903Z
UID:6bc05c81a259802439de0c14b3ceb7495c5f9a2a7030e903582b8766
CATEGORIES:Conferences - Seminars
DESCRIPTION:Prof. Carl Thompson\, MIT\, USA\nThin films and micro-/nano-st
 ructures\, such as patterned metal wire-like conductors\, are inherently u
 nstable and will undergo morphological evolution driven by surface energy 
 minimization.  This results in the break-up of purpose-built structures i
 nto islands.  This evolution\, which occurs while the material remains so
 lid\, is referred to as solid-state dewetting (SSD) or agglomeration. Lith
 ographically defined thin film micro-/nano-structures made from both polyc
 rystalline and single crystal films have been used to investigate the deta
 iled mechanisms that promote thermal stability or guide SSD to produce con
 trolled structures. Crystalline anisotropy has been shown to have an espec
 ially strong effect on morphological evolution\, and a new simulation meth
 od that accounts for anisotropy has been developed that successfully repro
 duces phenomenology observed in experiments.\n\nBio: Professor Thompson is
  the Stavros Salapatas Professor of Materials Science and Engineering at M
 IT . He received an S.B. in Materials Science and Engineering from MIT and
  a Ph.D. in Applied Physics from Harvard University\, and joined the MIT f
 aculty in 1983.  He was the director of MIT’s Materials Processing Cent
 er from 2008 to 2017\, and director of MIT’s Materials Research Laborato
 ry from 2017 to 2023. Professor Thompson also served in leadership positio
 ns in several of MIT’s international programs and is a Fellow and past
 ‐president of the Materials Research Society. His research interests foc
 us on the processing of thin films and nanostructures for applications in 
 microelectronic\, microelectromechanical and microelectrochemical systems.
  Current activities focus on the reliability of IC interconnects\, GaN‐b
 ased devices\, and heterogeneously integrated microsystems\, as well as ge
 neral kinetic mechanisms that control the evolution of internal defects an
 d morphology of thin films and micro‐/nano‐scale structures.\n\n 
LOCATION:MXF 1 https://plan.epfl.ch/?room==MXF%201
STATUS:CONFIRMED
END:VEVENT
END:VCALENDAR