BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//Memento EPFL//
BEGIN:VEVENT
SUMMARY:MTEI Seminar by Dr. Ad van den Oord\, Durham University Business S
 chool
DTSTART:20130117T093000
DTEND:20130117T110000
DTSTAMP:20260428T214821Z
UID:232f8c46931ec0eb346414212b0411c283d35fac90c766fd4e2b354c
CATEGORIES:Conferences - Seminars
DESCRIPTION:Dr. Ad van den Oord\, Durham University Business School\n"The 
 Relatedness of Technology: Towards a New Measure of Technological Distance
 "Abstract\nOver the years\, technology has become increasingly important f
 or the study of management and organization\, and its measurement has beco
 me a major point on the research agenda for many academics. In most empiri
 cal studies\, scholars typically assume that technological domains are all
  equally distant (i.e.\, dissimilar) from one another. This is\, however\,
  a faulty assumption\, as certain domains are more related (e.g.\, biotech
 nology and pharmaceuticals) than others (e.g.\, biotechnology and automoti
 ve). As we will demonstrate in this paper\, this has important implication
 s for the measurement of technological knowledge both within and across fi
 rms. By generalizing Jaffe’s (1986) measure of angular separation\, we a
 re able to show the existence of a severe bias in the traditional measurem
 ent of technological distance.Keywords: Technology\, technological knowled
 ge\, technological landscapes\, technological domains\, patent data\, dist
 ance\, measurement.
LOCATION:ODY 4.03\, VIP room http://plan.epfl.ch/?zoom=20&recenter_y=58638
 00.12869&recenter_x=731560.22521&layerNodes=fonds\,batiments\,labels\,even
 ts_surface\,events_line\,events_label\,information\,parkings_publics\,arre
 ts_metro\,evenem
STATUS:CONFIRMED
END:VEVENT
END:VCALENDAR