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SUMMARY:Silicon is ductile and thinner is stronger: recent insights from i
 n-situ SEM\, variable temperature nanomechanical testing
DTSTART:20130319T131500
DTEND:20130319T141500
DTSTAMP:20260916T043442Z
UID:917010e46713080e7b7d3167534a7e1ed0185d2d3222656e054b93b6
CATEGORIES:Conferences - Seminars
DESCRIPTION:Dr. Johann Michler\nBio : Johann Michler is currently head of 
 the Laboratory of Mechanics of Materials and Nanostructures at EMPA in Thu
 n. He studied Materials Science and received a PhD degree at EPFL in 2000.
  After his PhD he started at EMPA his activities as group leader. His curr
 ent research interest focuses on scale dependent mechanical properties of 
 materials. He is the author or co-author of more than 200 research papers 
 in peer-reviewed international journals and cofounded 2 spin-off\ncompanie
 s.\nAbstract : The creation of miniaturized mechanical structures and devi
 ces calls for an understanding of the mechanical properties of the semicon
 ductor and metallic materials used at these small length scales. Investiga
 tion of different types of loading\, such as compression or bending\, requ
 ires the development of appropriate miniaturized instrumentation and integ
 ration into different micro-analysis instruments (SEM\, optical probes etc
 .) allowing for in-situ microstructure analysis. The talk will illustrate 
 different materials case studies using in-situ nanomechanical testing: sam
 ple size and temperature dependent brittle to ductile transitions in semic
 onductors\, shear band formation in amorphous metals\, displacement bursts
  and thinness effect in crystalline metals.
LOCATION:ME B3 31 http://plan.epfl.ch/?room=MEB331
STATUS:CONFIRMED
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