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SUMMARY:Nanoscale Surface Force Measurement with Nonlinear Dynamics
DTSTART:20110215T110000
DTSTAMP:20260407T180319Z
UID:4c3df0631ccd9199cc8e64794ba18039d890e88ad794eedef8181502
CATEGORIES:Conferences - Seminars
DESCRIPTION:Prof. David Haviland\, Royal Institute of Technology\, Stockho
 lm\nThe Atomic Force Microscope (AFM) can be used to measure the minute fo
 rces between a sharp tip and a surface resulting from the chemical\, topog
 raphical (shape)\, and mechanical properties of the surface at the nanomet
 er scale. We have developed a method to rapidly and quantitatively measure
  the normal force vs. tip-surface separation\, by probing the nonlinear dy
 namics of an oscillating cantilever as it interacts with the surface. The 
 method involves the frequency mixing of two pure excitation tones and meas
 urement of the intermodulation\, or frequency mixing of these tones. The m
 ethod allows one to examine in detail the tip-surface interaction at each 
 pixel of an image acquired at typical AFM scan speeds. Being a dynamic met
 hod\, it allows for investigation of not only conservative (elastic) tip-s
 urface iterations\, but also dissipative (viscous) interaction.
LOCATION:PH L1 503
STATUS:CONFIRMED
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