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SUMMARY:Nanoscale Surface Force Measurement with Nonlinear Dynamics
DTSTART:20110215T110000
DTSTAMP:20260603T231332Z
UID:0da6f7f61b3857a8aa53eaa14575b02bec9e8417daed4c3122292f63
CATEGORIES:Conferences - Seminars
DESCRIPTION:Prof. David Haviland from the Royal Institute of Technology in
  Stockholm\nThe Atomic Force Microscope (AFM) can be used to measure the m
 inute forces between a sharp tip and a surface resulting from  the chemica
 l\, topographical (shape)\,  and mechanical properties of the surface at t
 he nanometer scale.  We have developed a method to rapidly and quantitativ
 ely measure the normal force vs. tip-surface separation\,  by probing the 
 nonlinear dynamics of an oscillating cantilever as it interacts with the s
 urface.  The method involves the frequency mixing of two pure excitation t
 ones and measurement of the intermodulation\, or frequency mixing of these
  tones.   The method allows one to examine in detail the tip-surface inter
 action at each pixel of an image acquired at typical AFM scan speeds.  Bei
 ng a dynamic method\, it allows for investigation of not only conservative
  (elastic) tip-surface iterations\, but also dissipative (viscous) interac
 tion.
LOCATION:PH L1 503
STATUS:CONFIRMED
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