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VERSION:2.0
PRODID:-//Memento EPFL//
BEGIN:VEVENT
SUMMARY:Semiconductor Devices Characterization 
DTSTART:20141014T090000
DTEND:20141014T170000
DTSTAMP:20260407T091036Z
UID:84317e72be4196f05f2c88bfb9afc8282c7885667a0358b5c4971ab1
CATEGORIES:Conferences - Seminars
DESCRIPTION:Keysight and its 25 collaborative partners\nTopics covered in 
 this seminar in two parallel tracs:CMOS Track:\n• Accurate & repeatable 
 on-wafer device extraction – Cascade Microtech\n• DC characterization 
 for emerging nano-technologies\n• Flicker noise & Random Telegraph Noise
 \n• Spice model libraries optimization for dedicated applicationPower & 
 RF Power Track:\n• High Power Devices measurement\n• III-V devices spi
 ce model (DynaFET…)\n• Nonlinear Component characterization\n• Non-5
 0ohm Load Pull solution – Maury
LOCATION:PSE D http://plan.epfl.ch/?lang=en&room=pse-d
STATUS:CONFIRMED
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