BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//Memento EPFL//
BEGIN:VEVENT
SUMMARY: Reliability of packaging in high-temperature control electronics 
DTSTART:20140926T170000
DTSTAMP:20260509T081306Z
UID:2c46f6f39a4969c620f8107f418303985607c9c528003ed144f50fea
CATEGORIES:Thesis defenses
DESCRIPTION:Conor Joseph SLATER\nThesis directors : Prof. P. Ryser\, Dr T.
  Maeder\nSystems and Robotics doctoral program.\nThesis 6297
LOCATION:Auditoire MXF 1 http://plan.epfl.ch/?zoom=19&recenter_y=5863946.2
 1509&recenter_x=730658.04689&layerNodes=fonds\,batiments\,labels\,informat
 ion\,parkings_publics\,arrets_metro\,transports_publics&floor=2&q=MXF_1
STATUS:CONFIRMED
END:VEVENT
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