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PRODID:-//Memento EPFL//
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SUMMARY:New XPS/AES at the School of Engineering : information meeting
DTSTART:20150203T121500
DTEND:20150203T130000
DTSTAMP:20260506T020313Z
UID:36c2d4d6dacd67f072eceee4332c8ee8c1345524c639b806a5f5cb5b
CATEGORIES:Conferences - Seminars
DESCRIPTION:Prof. H.-A. Klok (head of MHMC)\, Dr S. Mischler\nSince 1974 r
 esearchers from IMX and EPFL have access to surface analytical techniques 
 by XPS\, AES and SIMS managed till 2006 by the Laboratory of Metallurgical
  Chemistry and afterwards by the CIME. Since 2014 this task was taken over
  by the MHMC (Molecular and Hybrid Materials Characterization center \, ht
 tp://mhmc.epfl.ch/). This coincided with a revamp of the available equipme
 nt through the purchase of two advanced XPS and AES instruments that are n
 ow operational:\n- A PHI VersaProbeII XPS system featuring a small spot X-
 Ray beam\, automated charge compensation\, monoatomic and cluster ion guns
  (Ar+\, C60\, Ar cluster)\, heating/cooling stage\, angle resolves XPS.\n-
  A PHI 680 Scanning Auger Microscope with typical beam size in analytical 
 mode of 10 nm combined with Ar+ ion depth sputter profiling.\nTo celebrate
  the new equipment\, the MHMC invites you (and any other interested person
 ) to an information meeting on February 3\, 2015 12:15-13:00\, room MXG110
 . Refreshments will be available.\nThe program includes a welcome by Prof.
  H.-A. Klok (head of MHMC)\, the presentation by Dr S. Mischler (responsib
 le for the surface analysis platform of MHMC) of the new instruments and o
 f the services offered to EPFL users . At the end\, participants will have
  the opportunity to visit the surface analysis facilities.\nPlease\, in or
 der to facilitate organization\, fill the following Doodle if you intend t
 o participate: http://doodle.com/xwdkqfngbq9z93ng
LOCATION:MXF 1 https://plan.epfl.ch/?room==MXF%201
STATUS:CONFIRMED
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