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SUMMARY:Correlative Tomography - Spanning Length and Timescales
DTSTART:20150216T131500
DTSTAMP:20260408T090726Z
UID:1a4896217d13de55442fbfa2f7236a49b21740bc9310cfc447fa8e77
CATEGORIES:Conferences - Seminars
DESCRIPTION:Prof. Phil Withers\, Manchester University\nBio: Professor Phi
 lip Withers obtained his PhD in Metallurgy at Cambridge University and too
 k up a lectureship there\, before taking up a Chair in Manchester in 1998.
    His main interests lie in the application of advanced techniques to a
 ssess the structural integrity of engineering materials and components. To
  this end he has built instruments for residual stress measurement and 3D 
 imaging at central neutron and synchrotron facilities\, as well as foundin
 g a Unit for Stress and Damage Characterisation in Manchester\, work for w
 hich he was elected to the Royal Academy of Engineering in 2005. In 2007 h
 e became the founding Director of the University of Manchester Aerospace R
 esearch Institute linking over 100 academics within the University with th
 e aim of undertaking cross disciplinary research. In 2010 he set up the Ma
 nchester X-ray Imaging Facility combining both lab. X-ray scanners and a b
 eamline at the Diamond Light Source for 3D X-ray imaging across scales fro
 m 1m to 50nm which he co-directs with Professor Peter Lee. He was awarded 
 the Royal Society Armourers & Brasiers’ Company Prize for pioneering use
  of neutron and x-ray beams to map stresses and image components in 2010. 
 In 2012 Phil became the Director of the new BP International Centre for Ad
 vanced Materials\, aimed at advancing the fundamental understanding and us
 e of materials across a variety of oil and gas industrial applications.\nT
 ogether non destructive (X-ray) and destructive (serial section electron m
 icroscopy) enable us to probe materials behavior across a very wide range 
 of lengthscales and timescales.  In this presentation I will describe the
  multiscale 3D characterization workflows combining macroscale X-ray compu
 ted tomography (CT)\, micro X-ray CT\, nanoscale serial section FIB/SEM im
 aging and analysis\, and scanning transmission electron microscopy to stud
 y a range of materials degradation and repair processes. This approach all
 ows us to travel down the scales to better understand macroscale damage in
  terms of the underlying microstructure and to co-visualise structural\, c
 rystallographic (EBSD) and chemical (EDS) information.  Future workflows 
 and visualization software advances will enable the materials scientist to
  bring together multiple scales and information or undertake high resoluti
 on imaging with a high degree of knowledge of the local context.\nFinally\
 , the three pillars of materials science (microstructure-chemistry-perform
 ance) are traditionally studied separately in the microscopy suite\, the c
 hemistry lab and the mechanical test facility on different samples.  Corr
 elative techniques currently allow one to bring them all into registry in 
 three dimensions.
LOCATION:MXF 1 https://plan.epfl.ch/?room==MXF%201
STATUS:CONFIRMED
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