BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//Memento EPFL//
BEGIN:VEVENT
SUMMARY:Advances in synchrotron X-ray diffraction methods as a basis for n
 ew and improved tools in structural biology
DTSTART:20100308T100000
DTSTAMP:20260502T060643Z
UID:74c5a2ecb05e4d7605e4eef47422cc0f866fea4212f426b956df4be9
CATEGORIES:Conferences - Seminars
DESCRIPTION:Prof. Marc Schiltz\, EPFL SB IPSB LCR\nMacromolecular X-ray cr
 ystallography has dramatically changed since the pioneering work of Max Pe
 rutz. Among the many significant advances that had an impact on structural
  biology\, the advent of synchrotron radiation sources is perhaps the sing
 le most important event that has transformed the field and opened up compl
 etely new perspectives. While the high brilliance and the spectral charact
 eristics of synchrotron radiation have played a crucial role in the evolut
 ion that macromolecular crystallography has undergone over the past two de
 cades\, other remarkable properties of synchrotron radiation\, such as the
  transverse polarisation and the spatial coherence have\, up to now\, rema
 ined largely unexploited in macromolecular crystallography. I will present
  the outcome and prospective of our research projects in X-ray diffraction
  methods that are directed towards addressing some of the new challenges t
 hat have arisen in synchrotron-based structural biology. The move towards 
 ever smaller samples and more intense X-ray beams has now led to the situa
 tion where radiation damage has become the major limiting factor for most 
 experiments and imposes severe constraints on the minimal sample size and 
 lifetime. Under these circumstances\, it becomes of the outmost importance
  to be able to extract the maximum amount of information from X-ray diffra
 ction experiments. This can be achieved by making active use of the polari
 sation (through resonant scattering effects) and coherence properties of t
 he radiation produced by synchrotrons and at future XFEL sources. I will a
 lso present new methods that aim at exploiting hitherto inaccessible inten
 sity information by enlarging the range of samples that can be used in X-r
 ay diffraction analysis to include polycrystalline samples and/or nanocrys
 tals.
LOCATION:CE 5 - Centre Est
STATUS:CONFIRMED
END:VEVENT
END:VCALENDAR