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SUMMARY:From Microstructure to Macro Properties by Different Microscopy Te
 chniques
DTSTART:20091006T110000
DTSTAMP:20260502T043802Z
UID:f68e875de0149ea499117a914c3f67e9c2393d2a89ded20693a57e12
CATEGORIES:Conferences - Seminars
DESCRIPTION:Dr. Massoud Dadras\nMicrostructure is defined as the structure
  of materials above a microscopic scale. For example in the case of crysta
 lline materials\, the microstructure concerns the crystal grains and defec
 ts (volume defects such as voids and precipitates\, surface defects such a
 s grain boundaries and interfaces\, linear defects such as dislocations an
 d point defects such as vacancies).\nThe influence of microstructure on th
 e properties has been largely studied and different functions have been pr
 oposed to explain the relation between the interaction of dislocation and 
 defects on the bulk properties of materials\, some examples are: a) the Ha
 ll-Petch equation for influence of grain size on yield strength\, b) Orowa
 n equation explaining the influence of the presence of precipitate and its
  size and distribution on the mechanical properties and c) the relation be
 tween the density of defects and the electrical conductivity.\nThe electro
 n microscopes\, having mainly better resolution in comparison with other o
 bserving techniques\, were used to study the microstructure since 50ies an
 d largely contributed to explaining the macro-properties.\nDifferent micro
 scopy techniques are available in the facilities in Neuchâtel such as Tra
 nsmission Electron Microscope (TEM)\, Environmental Scanning Electron Micr
 oscope (ESEM)\, Cryo-SEM\, EBIC\, EBSD\, Scanning Probe Microscope and Con
 focal Microscope.\nThe importance of microstructural studies by different 
 microscopy techniques for explaining the properties will be presented thro
 ugh some examples.
LOCATION:EPFL - IMT-NE\, Breguet 2\, Neuchâtel  Salle MT2 / 11h00
STATUS:CONFIRMED
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