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SUMMARY:Reduced basis method for 3D electromagnetic
DTSTART:20090916T161500
DTSTAMP:20260407T071801Z
UID:751ad93235740d181bc11cc22e587c1d89642d92f0e24017623183b1
CATEGORIES:Conferences - Seminars
DESCRIPTION:Dr. Frank Schmidt\nThe reduced basis method enables fast and r
 obust evaluation of input-output relationships described by parametrized p
 artial differential equations. In the present work we apply the technique 
 to geometrically parameterized electromagnetic scattering problems on unbo
 unded domains in 2D and 3D. The main idea of the reduced basis method is t
 o split up the solution process of the parameterized model into an expensi
 ve offline and a cheap online part. After constructing the reduced basis o
 ffline\, the reduced model can be solved online very fast in the order of 
 seconds or below. Error estimators assure the reliability of the reduced b
 asis solution and are used for self adaptive construction of the reduced s
 ystem.\nDue to the very high number of terms in the affine expansion of th
 e parametrized system\, especially in 3D\, currently used online-offline d
 ecomposition of the error estimator is practically impossible. Online\ncom
 putation of the residuum becomes too expensive. Here we present a new meth
 od for estimation of the residuum in the reduced basis context which is in
 spired by the sub-domain residual method. The good performance of the new 
 residuum estimator is demonstrated numerically. As application examples we
  consider scattering problems from 2D and 3D photolithographical masks and
  an optimization related to optical proximity corrections.
LOCATION:MAA110
STATUS:CONFIRMED
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