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VERSION:2.0
PRODID:-//Memento EPFL//
BEGIN:VEVENT
SUMMARY: High resolution eddy current inspection and eddy current testing 
 for additive manufacturing 
DTSTART:20160429T173000
DTSTAMP:20260413T094603Z
UID:8cc34e21bb3ca3d9e4ec0e2427d4f6dced610c4d927cf89efc969c54
CATEGORIES:Thesis defenses
DESCRIPTION:David Florian HIPPERT\nThesis directors : Prof. H. Bleuler \, 
 Dr G. R. Santi\nRobotics\, Control and Intelligent Systems doctoral progra
 m.\nThesis 6746
LOCATION:Auditoire CM1 http://plan.epfl.ch/?zoom=20&recenter_y=5864180.890
 29&recenter_x=731090.55291&layerNodes=fonds\,batiments\,labels\,informatio
 n\,parkings_publics\,arrets_metro\,transports_publics&floor=1&q=Auditoire_
 CM1
STATUS:CONFIRMED
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