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SUMMARY:The SICLOP detector: a novel imaging method in scanning electron m
 icroscopy
DTSTART:20160602T143000
DTEND:20160602T153000
DTSTAMP:20260510T013117Z
UID:2f4b4ee66ded0b8ff6a8eda41d5c50594ab0f6d939f457c58bef33e6
CATEGORIES:Conferences - Seminars
DESCRIPTION:Jean-Claude Menard\, Electron Microscopist\, Founder of Ahead 
 Microscopy\nMost modern digital imaging systems are based as a two dimensi
 ons matrix (the 2D image)\, where the picture element (i.e. the pixel) is 
 defined as the quantum based unit from some thousands\, millions or even 
 billions that compose the watched scene.\nIn a Scaning Electron Microscope
  (SEM)\, by impinging the sample with a controlled electron beam\, can han
 dle multiple progressive and continuous magnifications from the visible sc
 ale to nanoscale (some 10-9 meters) offering huge capabilities in providin
 g information in both life and material sciences. The SEM electron beam to
  sample interactions provides a universe of re-emissions composed by elect
 on species that handle sample information in deeper scales. Most of them h
 ave been described and classified in details with single techniques using 
 various and dedicated 0D detectors.\nThe new SICLOP (Spacial Imaging Contr
 ol in Live Operation) detector is\, by its concept imported from a suppose
 d or admitted human vision strategy: fed with predictable patterns and upl
 oaded from a optronic calculator. Finally\, its output signal is still dim
 ensionless\, but resluting from a direct correlated and coheret calculatio
 n between the patterns and the watched scene.\nFrom various examples in SE
 M wlctron detection\, the SICLOP concept will be presented and discussed a
 s a possbile efficient human like imaging device.
LOCATION:SV1717.1 http://plan.epfl.ch/?lang=fr&room=SV1717.1
STATUS:CONFIRMED
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