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SUMMARY:Atomic scale investigation of two dimensional materials using tran
 smission electron microscopy
DTSTART:20180312T131500
DTEND:20180312T141500
DTSTAMP:20260928T192433Z
UID:97c831faa1b449399e313fc89222947ad88c3bd9c5b32189e6701c6c
CATEGORIES:Conferences - Seminars
DESCRIPTION:Dr Hanako OKUNO\, CEA-Grenoble\, France\nTwo dimensional (2D) 
 layered structures\, such as graphene and transition metal dichalcogenides
  (TMDs)\, have attracted much attention for future electronics and optoele
 ctronics due to their unique electronic structures. The properties of 2D m
 aterials are strongly influenced by their atomic structures. Visualizing t
 heir structural and chemical configuration at atomic scale is thus essenti
 al to understand and further control these atomically thin materials. Rece
 ntly a low-voltage aberration corrected transmission electron microscopy (
 LVAC-TEM) has been intensively developed and recognized as the most powerf
 ul technique giving an atomic scale imaging of one or few atom thick layer
  materials\, which provides precise local structural information such as v
 acancies and dislocations. In addition\, this technique also allows to mod
 ify the atomic structure in 2D layers by electron irradiation. Therefore\,
  we are able to follow atom displacements during the defect formation to s
 tudy their dynamics. In this talk\, LVAC-TEM characterization techniques f
 or the study of 2D materials concerning their defects\, strain\, dopants a
 nd further dynamics will be demonstrated and how these structural analysis
  can contribute to the domain of 2D engineering will be discussed.\n \n[R
 eferences]\nA novel 2-step-ALD route to ultra-thin MoS2 films on SiO2 thro
 ugh a surface organometallic intermediate\, S. Xadot\, O. Renault\; M. Fre
 gnaux\, D. Rouchon\, E. Nolot\, K. Szeto\, C. Thieuleux\, L. Veyre\, H. Ok
 uno\, F. Martin and A. Quadrelli\, Nanoscale 9\, 538 (2017)\nCVD graphene 
 recrystallization as a new route to tune graphene structure and properties
 \, A. V. Tyrnina\, H. Okuno\, P. Pochet\, J. Dijon\, Carbon 102 (1) 499-50
 5 (2016)\nStructural evolution of dilute magnetic (Sn\, Mn)Se films grown 
 by molecular beam epitaxy\, V. Kanzyuba\, S. Dong\, X. Liu\, X. Li\, S. Ro
 uvimov\, H. Okuno\, H. Mariette\, X. Zhang\, S. Ptasinska\, B. D. Tracy\, 
 D. J. Smith\, M. Dobrowolska and J. Furdyna\, J. Appl. Phys. 121\, 075301 
 (2017)\nBio: Hanako OKUNO graduated with a Master Degree in Materials Scie
 nce and engineering from Tokyo Institute of Technology in 1999. She receiv
 ed PhD in Materials Science from Louvain catholic University in Belgium\, 
 entitled “Synthesis and characterization of carbon based materials” in
  2006. She worked in advanced microscopy to develop quantitative chemical 
 atomic resolution imaging on semiconductor during her post-doc fellows at 
 NIMS in Japan and CEA in France and then joined CEA LITEN in 2009 where sh
 e worked on the integration of CNTs in microelectronic device applications
 . Since 2012\, she has been working in Laboratory of advanced electron mic
 roscopy in CEA INA\, whereas she specializes advanced microscopy for two-d
 imensional material study using low-voltage aberration corrected TEM techn
 iques.\n 
LOCATION:MXF 1 https://plan.epfl.ch/?room==MXF%201
STATUS:CONFIRMED
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