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VERSION:2.0
PRODID:-//Memento EPFL//
BEGIN:VEVENT
SUMMARY:EPFL - MicroNanoFabrication Annual Review Meeting
DTSTART:20190507T093000
DTEND:20190507T170000
DTSTAMP:20260427T220018Z
UID:ac60a5a71175d3894ec55191a7d1817e39663ac17ada3a91f973a96d
CATEGORIES:Conferences - Seminars
DESCRIPTION:This event presents research achievements of the past year a
 nd encourage interaction among professors\, researchers\, students\, and 
 industry partners. For this 20th edition\, 10 invited speakers will be pr
 esent and 219 posters will be presented. \nThe scope of the forum is Mi
 cro & Nano Fabrication Techniques used in the following fields:\n \n- Mi
 cro and Nanoelectronics (Soft Bioelectronic\, 3D Integration\, Nanowires\,
  High-Q Resonators\, New materials\, ...)\n- Biomedical Applications (Micr
 ofluidics\, Microelectrodes\, Lab on a Chip\, Probes\, Neuroprosthetics\,
   ...)\n- MEMS\, NEMS (Sensors and Actuators\, Motors\, Tweezers\,  Arti
 ficial  Muscles\, Micro and Nanomechanics\, ...) \n- Optics (Nanophotoni
 cs\, Optomechanics\, Photonic Crystals\, MOEMS\, Optofluidics\, Fibers\, .
 ..)\n- Nanostructure Physics (VCSELs\, Quantum Opto-Electronics\, III/V De
 vices\, Nanotubes\, Nanowires\, Nanomechanics\, ...)\n- Material Sciences 
 (Photovoltaic Materials\, Piezoelectric materials\, Nanoparticles\, Energy
  Harvesting\, Micro Fuel Cells\, ...)\n- Fabrication Technologies (Lithogr
 aphy\, Etching\, Thin Films\, ALD\, EBEAM\, CMP\, Self assembly\, Inkjet P
 rinting\, PDMS\, ...)\n- Metrology and Defect Analysis (SEM\, FIB\, Ellips
 ometry\, Reflectometry\, AFM\, EDX\, Stress\, Conductivity\, ...)\n- Packa
 ging and Assembly (Grinding\, Wire Bonding\, Encapsulation\, ...)\n\nClick
  here for the full program\nClick here for the list of posters\n\nRegistra
 tion is mandatory\, by sending an email to secretaries.cmi@epfl.ch\, inc
 luding your name and first name\, organization and email address.
LOCATION:EPFL\, Forum Rolex Learning Center\, RLC E1 240 http://plan.epfl.
 ch/?room=RLC%20E1%20240
STATUS:CONFIRMED
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