BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//Memento EPFL//
BEGIN:VEVENT
SUMMARY:Metrology with Light: Bright Perspectives!
DTSTART:20190517T031500
DTEND:20190517T041500
DTSTAMP:20260408T105159Z
UID:7c66b47141458c3af43dc6daa0efb1be15601b1e04319d00e62cbb58
CATEGORIES:Conferences - Seminars
DESCRIPTION:Karsten Buse\, director of Fraunhofer Institute of Physical Me
 asurement Techniques IPM and Professor at the Department of Microsystems E
 ngineering at the University of Freiburg\, heading the group “Optical Sy
 stems”.\nThe measurement of physical parameters with light is contact-fr
 ee\, parallel\, of high precision and with excellent temporal resolution. 
 Physicists employ these outstanding properties of light since centuries. M
 icroelectronics and advanced data processing plus innovations in photonics
  are now making optical metrology fast\, robust\, compact and cheap\, revo
 lutionizing industrial fields like quality control of parts\, object- and 
 shape recognition\, as well as gas- and process technology. The presentati
 on will visualize this evolution\, up to cutting-edge technologies includi
 ng frequency combs and quantum metrology. Special emphasis will be here on
  solutions based on second-order nonlinearities and whispering-gallery res
 onators\, with wide spectral coverage.\n 
LOCATION:BS 270 https://plan.epfl.ch/?room=BS270
STATUS:CONFIRMED
END:VEVENT
END:VCALENDAR