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SUMMARY:Reliability Evaluation of Emerging Devises
DTSTART:20120911T140000
DTSTAMP:20260407T020743Z
UID:4f27a50f784b8fa4cb5fa45bbc6e48d2adf1684bb2851e1407a2d5bb
CATEGORIES:Conferences - Seminars
DESCRIPTION:Mr. Hassan Mohammadi Ghasemzadeh\nEDIC Candidacy Exam:\nExam p
 resident: Prof. Andreas Burg\nThesis director: Prof. Giovanni De Micheli\n
 Co-examiner: Prof. David Atienza\n\nResearch Proposal\n\nGREDA: A Fast and
  More Accurate Gate Reliability EDA Tool by Walid Ibrahim\, Valeriu Beiu a
 nd Azam Beg.\nInvestigation on Variability in Metal-Gate Si Nanowire MOSFE
 Ts: Analysis of Variation Sources and Experimental Characterization by Run
 sheng Wang et al.\nGate-Level Redundancy: A New Design-for-Reliability Par
 adigm for Nanotechnologies by  Ali Namazi  and Mehrdad Nourani.
LOCATION:INF328 http://plan.epfl.ch/
STATUS:CONFIRMED
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