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SUMMARY:Master Thesis Presentation - Characterization of Flat-Fielding Sys
 tems for Super-Resolution Microscopy
DTSTART:20190823T100000
DTSTAMP:20260408T085157Z
UID:2d29efad0798fee74fc0bc73cb9d85f4870ec6798f25d3ec0184b335
CATEGORIES:Miscellaneous
DESCRIPTION:Khalid Ibrahim\nThe laser beams used at the heart of many micr
 oscopy techniques have Gaussian profiles — with the beam intensity pea
 king at the center and decaying radially. In super-resolution microscopy\,
  this fact leads to a varying\, field-dependent image quality. Several fla
 t-fielding mechanisms exist to tackle this issue\, including field-mappin
 g and beam-integration methods. Such techniques transform an input Gaussi
 an profile into a uniform one\, reducing the variations in image quality.
  In this master's project\, beam shaping systems of both kinds are charac
 terized experimentally to find out which method is more suitable for wide-
 field illumination and multipoint-scanning illumination.
LOCATION:BSP 231 https://map.epfl.ch/?dim_floor=2&lang=en&dim_lang=en&base
 layer_ref=grp_backgrounds&map_x=533268&map_y=152462&map_zoom=9&tree_groups
 =centres_nevralgiques%2Cacces%2Cmobilite_reduite%2Censeignement%2Ccom
STATUS:CONFIRMED
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