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SUMMARY:2019 Advanced Course: Introduction to scanning electron microscopy
  microanalysis techniques
DTSTART:20191211T080000
DTEND:20191213T170000
DTSTAMP:20260511T150731Z
UID:d73ad9cf8170d27383bc8ca293d1ce5ee1a45e1a5fafe5defb155560
CATEGORIES:Internal trainings
DESCRIPTION:Dr. Xavier Maeder\; Dr. Johann Michler\nScanning electron micr
 oscopes (SEMs) are the Swiss Army knives of materials analysis instruments
 . Modern SEMs in particular\, when combined with focused ion beams (Dual b
 eam FIBs)\, provide a larger number of multimodal imaging and different an
 alytical methods.\n\nObjectives\nThe course format consists of introductor
 y lectures in the morning\, and then lectures on advanced techniques and p
 ractical work in the afternoon in front of SEMs. The following subjects wi
 ll be presented during the course:\n\n– Basics of the scanning electron 
 microscopy and focused ion beam instruments (construction principles\, sig
 nals\, interaction with the sample)\n– Advanced imaging modes: STEM\, lo
 w tension microscopy\, high vacuum\, ion channeling\n– Advanced microstr
 ucture investigation with EBSD and transmission EBSD orientation mapping (
 EBSD strain and stress analyses with cross correlation technique)\n– Che
 mical analyses with EDS\, WDS and μ-XRF\n– Chemical depth profile with 
 FIB-TOF-SIMS\n– Raman spectrometry for phase and strain/stress analyses\
 n\nThe techniques will be explored in small groups on real samples in fron
 t of SEMs. Full details can be found on the course website.\n\nTarget audi
 ence and registration\nThis course is open to participants with a basic ba
 ckground in materials science\, mechanical engineering\, chemical engineer
 ing\, micro-technology or physics and is targeted towards both industrial 
 and academic users of analytical SEMs. The course may be validated for 1 E
 CTS credit in the doctoral programmes of EPFL and ETH Zurich\, after accep
 tance by the corresponding institution. In this case\, full attendance and
  a final examination after the end of the course on the final day is requi
 red.
LOCATION:
STATUS:CONFIRMED
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