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SUMMARY:Imaging: Intelligence on the Nanoscale
DTSTART:20200220T160000
DTEND:20200220T180000
DTSTAMP:20260407T003008Z
UID:332ee8a868486d460eaf028aec04b0ddfee323ad6f64850d3a32345b
CATEGORIES:Conferences - Seminars
DESCRIPTION:Prof. Gabriel Aeppli   Paul Scherrer Institut\, Villigen\, S
 witzerland  Department of Physics\, ETH Zürich Institut de Physique\, E
 PFL\nNatural and artificial intelligence are defined by wiring diagrams fo
 r circuits implemented using proteins and silicon respectively. Remarkably
 \, both biology and silicon chip fabrication are more advanced in their ca
 pacity to define the platforms for intelligence than is the technology for
  mapping the outcomes. Conventional high-resolution microscopy for imaging
  the interior of three- dimensional objects typically entails destructive 
 sample preparation followed by electron microscopy of resulting surfaces o
 r sections. Here we describe X-ray ptychography\, a mixed real space/recip
 rocal space („wavelet“) technique\, which is non-destructive and provi
 des three-dimensional images at steadily improving resolution\, which have
  now reached 15 nanometers. We show applications to integrated circuit ins
 pection\, with implications from quality control to security\, and discuss
  impact on brain science. \n\nInformation & Registration: https://www.ep
 fl.ch/research/domains/imaging/imaging-intelligence-on-the-nanoscale/
LOCATION:SV 1717 https://plan.epfl.ch/?room==SV%201717
STATUS:CONFIRMED
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