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SUMMARY:Exploring 2D materials at high resolution\, high sensitivity\, hig
 h speed\, high efficiency\, and low dose
DTSTART:20210413T143000
DTEND:20210413T153000
DTSTAMP:20260407T055629Z
UID:b1e8fb071d2c1d73f37c5051f67593d0b09a98ad1644efac0ba0b7e5
CATEGORIES:Conferences - Seminars
DESCRIPTION:Prof. Christoph Koch - Humboldt University Berlin\nAberration
 -correction\, monochromation and high-acceptance angle spectrometers in st
 ate-of-the-art transmission electron microscopes make it possible to obtai
 n information about the local atomic and electronic structure of the inves
 tigated sample with high spatial resolution and high energy resolution. Th
 e ability to detect both spectra and electron diffraction patterns with a 
 fast direct electron detector allows every electron to be counted without 
 any readout noise and with high efficiency\, since comparatively few elect
 rons are thrown away due to the use of apertures or lossy detection. This 
 is particularly relevant for 2D materials\, where the recorded signal is d
 ue to individual atoms. This presentation will demonstrate the acquisition
  of EELS data with < 6 meV energy resolution and zero-loss filtered diffra
 ction patterns with > 15\,000 frames per second on a hybrid-pixel direct d
 etector\, as well as the extraction of quantitative dielectric functions\,
  surface plasmon dispersion curves and damping\, and atomically-resolved m
 aps of the electrostatic potential and charge density from such data.
LOCATION:Zoom https://epfl.zoom.us/j/89143339434?pwd=dm44ekhMaHcwck53SDhPY
 VJsYVoxZz09
STATUS:CONFIRMED
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