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VERSION:2.0
PRODID:-//Memento EPFL//
BEGIN:VEVENT
SUMMARY:New Reliability Assessment of MEMS Components under Accumulative T
 esting for Space Applications
DTSTART:20211021T173000
DTSTAMP:20260610T082413Z
UID:440b98f4264918d1d550444f957be15357c5987a6393eb5c5bdb5e1a
CATEGORIES:Thesis defenses
DESCRIPTION:Maxime AUCHLIN\nThesis Directors: Prof. V. Gass\, Dr O. Sereda
 \nElectrical Engineering doctoral program\nThesis Nr. 8670\n\nTo take par
 t in the public defense\, please contact directly the speaker
LOCATION:Zoom meeting
STATUS:CONFIRMED
END:VEVENT
END:VCALENDAR