Do more with less: bringing full hardware and software solutions to push the boundaries for advanced electron microscope solutions and sample integrity preservation.
Event details
| Date | 19.09.2024 |
| Hour | 13:30 › 15:00 |
| Speaker | Paolo Longo |
| Location |
MXC-315
Online
|
| Category | Conferences - Seminars |
| Event Language | English |
Paolo Longo, Sorin Lazar, Maria Meledina, Jain Noopur, Peter Tiemeijer, Maarten Wirix.
Thermo Fisher Scientific, Eindhoven, The Netherlands
Over the last decades we have witnessed a tremendous development in advanced transmission electron microscopy. To name a few, probe correctors have become more powerful and now in combination with ultra-brightness electron sources 60 – 70pm spatial resolution in STEM can be routinely reached with nearly 1nA probe current, improvements in energy resolution have led to phonon spectroscopy, EDS detector systems have become 6x more efficient and sensitive with the latest generation leading to low-dose data collection and in-situ analytical studies, detectors are now capable to count electrons dramatically reducing the contribution of instrumental noise and that has led to the revolution in cryo-EM. Very recently with the market introduction of the Iliad (S)TEM microscope platform, Thermo Fisher Scientific has brought, for the very time, full microscope hardware and software integration that now extends and includes the Iliad EELS spectrometer and energy filter. Multimodal technique approach is extremely important to properly address the steady growing interest towards energy based and organic materials for advanced applications. The behaviour of this new class of materials can be dominated by processes occurring at defects, interfaces, and grain or phase boundaries and Electron Microscopy (EM) has long been a technique of choice to analyse these complex heterogeneous systems at the atomic level. However, these materials are often prone to changes upon exposure to electron beam, creating challenging conditions for imaging and analytical data collection and reliability. Here not only the best most sensitive hardware is important to successfully extract sub-Angstrom level information but also the best approaches in terms of electron dose optimization.
In this presentation we will discuss how the new technologies implemented in the Iliad (S)TEM and the full hardware and software can be employed to preserve sample integrity. Given the need to accommodate the characterization of many different materials in the same transmission electron microscope, not one single approach but a toolbox of many strategies will benefit most multi-user facilities and lead to higher success in pushing the boundaries of advanced atomic level investigation.
Thermo Fisher Scientific, Eindhoven, The Netherlands
Over the last decades we have witnessed a tremendous development in advanced transmission electron microscopy. To name a few, probe correctors have become more powerful and now in combination with ultra-brightness electron sources 60 – 70pm spatial resolution in STEM can be routinely reached with nearly 1nA probe current, improvements in energy resolution have led to phonon spectroscopy, EDS detector systems have become 6x more efficient and sensitive with the latest generation leading to low-dose data collection and in-situ analytical studies, detectors are now capable to count electrons dramatically reducing the contribution of instrumental noise and that has led to the revolution in cryo-EM. Very recently with the market introduction of the Iliad (S)TEM microscope platform, Thermo Fisher Scientific has brought, for the very time, full microscope hardware and software integration that now extends and includes the Iliad EELS spectrometer and energy filter. Multimodal technique approach is extremely important to properly address the steady growing interest towards energy based and organic materials for advanced applications. The behaviour of this new class of materials can be dominated by processes occurring at defects, interfaces, and grain or phase boundaries and Electron Microscopy (EM) has long been a technique of choice to analyse these complex heterogeneous systems at the atomic level. However, these materials are often prone to changes upon exposure to electron beam, creating challenging conditions for imaging and analytical data collection and reliability. Here not only the best most sensitive hardware is important to successfully extract sub-Angstrom level information but also the best approaches in terms of electron dose optimization.
In this presentation we will discuss how the new technologies implemented in the Iliad (S)TEM and the full hardware and software can be employed to preserve sample integrity. Given the need to accommodate the characterization of many different materials in the same transmission electron microscope, not one single approach but a toolbox of many strategies will benefit most multi-user facilities and lead to higher success in pushing the boundaries of advanced atomic level investigation.
Practical information
- General public
- Free
Organizer
- CIME
Contact
- Marco Cantoni