High Precision Depth Estimation using Structured Light with Application to 2.50 Printing

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Event details

Date 27.11.2015
Hour 16:00
Speaker Marjan Shahpaski
Location
Category Conferences - Seminars
EDIC Candidacy Exam:
Exam president:  Prof. Pascal Fua
Thesis director: Prof. Sabine Süsstrunk
Co-examiner: Dr Ronan Boulic

Research Proposal

A state of the art in structured light patterns for surface profilometry by Salvi, J., Fernandez, S., Pribanic, T., and Llado, X. Pattern recognition 43.8 (2010): 2666-2680
A practical approach to 3D scanning in the presence of interreflections, subsurface scattering and defocus by Gupta, M., Agrawal, A., Veeraraghavan, A., and Narasimhan, S. G. International journal of computer vision 102.1-3 (2013): 33-55.
Dynamic 3-D shape measurement method: a review by Su, X., and Zhang, Q. Optics and Lasers in Engineering 48.2 (2010): 191-204




Practical information

  • General public
  • Free

Contact

  • Evelyn Duperrex

Tags

EDIC Candidacy Exam

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