Increasing the throughput in FIB/SEM tomography and targeted cryo-lamella preparation
Event details
Date | 29.03.2019 |
Hour | 14:00 |
Speaker | Professor Alex de Marco, Monash University, Melbourne, Australia http://www.demarco-lab.com/research |
Location | |
Category | Conferences - Seminars |
Focused Ion Beam (FIB) milling is a key technology for nano-scale cellular imaging. The utility of FIB ranges from large volume imaging of resin embedded samples to cryo-lamella preparation of frozen-hydrated samples, which make this technology indispensable for modern imaging requirements. Our work demonstrates the advantages of working with non-conventional plasma FIB sources (especially the use of reactive species such as oxygen) for fast FIB/SEM tomography and cryo-lamella preparation, demonstrating a throughput increase up to 30% and superior sample compatibility. In association with the use of optimised beams we developed an integrated correlative light and FIB/SEM setup which removes the need of cryo-transfers between cryo-light microscopy and cryo-lamella preparation. This setup simplifies the procedure for correlative imaging, it allows better targeted cryo-lamella preparation and reduces the ice contamination which typically curses cryo-samples.
Bio :
I obtained my PhD at EMBL working in the group of John Briggs. Here, I contributed to the development of image processing for high resolution sub-tomogram averaging while investigating the structural changes occurring during the viral maturation of HIV-1. After my PhD I moved to FEI Company (now part of ThermoFisher Scientific) where I worked as product manager for FIB/SEM microscopes and correlative microscopy. At the end of 2015 I established my laboratory at Monash University. Here, our main focus is on methods and hardware development for cryo-EM and correlative FIB/SEM microscopy.
Practical information
- General public
- Free
Organizer
- Professor Pierre Gönczy
Contact
- Niccolo Banterle https://people.epfl.ch/niccolo.banterle