Reliability Evaluation of Emerging Devises
Event details
| Date | 11.09.2012 |
| Hour | 14:00 |
| Speaker | Mr. Hassan Mohammadi Ghasemzadeh |
| Location | |
| Category | Conferences - Seminars |
EDIC Candidacy Exam:
Exam president: Prof. Andreas Burg
Thesis director: Prof. Giovanni De Micheli
Co-examiner: Prof. David Atienza
Research Proposal
GREDA: A Fast and More Accurate Gate Reliability EDA Tool by Walid Ibrahim, Valeriu Beiu and Azam Beg.
Investigation on Variability in Metal-Gate Si Nanowire MOSFETs: Analysis of Variation Sources and Experimental Characterization by Runsheng Wang et al.
Gate-Level Redundancy: A New Design-for-Reliability Paradigm for Nanotechnologies by Ali Namazi and Mehrdad Nourani.
Exam president: Prof. Andreas Burg
Thesis director: Prof. Giovanni De Micheli
Co-examiner: Prof. David Atienza
Research Proposal
GREDA: A Fast and More Accurate Gate Reliability EDA Tool by Walid Ibrahim, Valeriu Beiu and Azam Beg.
Investigation on Variability in Metal-Gate Si Nanowire MOSFETs: Analysis of Variation Sources and Experimental Characterization by Runsheng Wang et al.
Gate-Level Redundancy: A New Design-for-Reliability Paradigm for Nanotechnologies by Ali Namazi and Mehrdad Nourani.
Practical information
- General public
- Free
Contact
- Evelyn Duperrex