Security Testing of Complex Systems with Two Sides of Inputs

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Event details

Date 20.06.2022
Hour 16:0018:00
Speaker Zhiyao Feng
Location
Category Conferences - Seminars
EDIC candidacy exam
Exam president: Prof. James Larus
Thesis advisor: Prof. Mathias Payer
Co-examiner: Prof. Jean-Pierre Hubaux

Abstract

Background papers
  1. Fuzzing File Systems via Two-Dimensional Input Space Exploration, https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8835267&tag=1
  2. Evaluating File System Reliability on Solid State Drives, https://www.usenix.org/system/files/atc19-jaffer.pdf
  3. MOPT: Optimized Mutation Scheduling for Fuzzers, https://www.usenix.org/system/files/sec19-lyu.pdf

Practical information

  • General public
  • Free

Tags

EDIC candidacy exam

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