Semiconductor Devices Characterization
Event details
| Date | 14.10.2014 |
| Hour | 09:00 › 17:00 |
| Speaker | Keysight and its 25 collaborative partners |
| Location | |
| Category | Conferences - Seminars |
Topics covered in this seminar in two parallel tracs:
CMOS Track:
• Accurate & repeatable on-wafer device extraction – Cascade Microtech
• DC characterization for emerging nano-technologies
• Flicker noise & Random Telegraph Noise
• Spice model libraries optimization for dedicated application
Power & RF Power Track:
• High Power Devices measurement
• III-V devices spice model (DynaFET…)
• Nonlinear Component characterization
• Non-50ohm Load Pull solution – Maury
CMOS Track:
• Accurate & repeatable on-wafer device extraction – Cascade Microtech
• DC characterization for emerging nano-technologies
• Flicker noise & Random Telegraph Noise
• Spice model libraries optimization for dedicated application
Power & RF Power Track:
• High Power Devices measurement
• III-V devices spice model (DynaFET…)
• Nonlinear Component characterization
• Non-50ohm Load Pull solution – Maury
Links
Practical information
- General public
- Free
Organizer
Contact
- W. Grabinski; Technical Operations Manager at CARPLAT IEL EPFL