Semiconductor Devices Characterization

Thumbnail

Event details

Date 14.10.2014
Hour 09:0017:00
Speaker Keysight and its 25 collaborative partners
Location
Category Conferences - Seminars
Topics covered in this seminar in two parallel tracs:

CMOS Track:
• Accurate & repeatable on-wafer device extraction – Cascade Microtech
• DC characterization for emerging nano-technologies
• Flicker noise & Random Telegraph Noise
• Spice model libraries optimization for dedicated application

Power & RF Power Track:
• High Power Devices measurement
• III-V devices spice model (DynaFET…)
• Nonlinear Component characterization
• Non-50ohm Load Pull solution – Maury

Practical information

  • General public
  • Free

Organizer

Contact

  • W. Grabinski; Technical Operations Manager at CARPLAT IEL EPFL

Event broadcasted in

Share