MTEI Seminar by Dr. Ad van den Oord, Durham University Business School
Event details
| Date | 17.01.2013 |
| Hour | 09:30 › 11:00 |
| Speaker | Dr. Ad van den Oord, Durham University Business School |
| Location | |
| Category | Conferences - Seminars |
"The Relatedness of Technology: Towards a New Measure of Technological Distance"
Abstract
Over the years, technology has become increasingly important for the study of management and organization, and its measurement has become a major point on the research agenda for many academics. In most empirical studies, scholars typically assume that technological domains are all equally distant (i.e., dissimilar) from one another. This is, however, a faulty assumption, as certain domains are more related (e.g., biotechnology and pharmaceuticals) than others (e.g., biotechnology and automotive). As we will demonstrate in this paper, this has important implications for the measurement of technological knowledge both within and across firms. By generalizing Jaffe’s (1986) measure of angular separation, we are able to show the existence of a severe bias in the traditional measurement of technological distance.
Keywords: Technology, technological knowledge, technological landscapes, technological domains, patent data, distance, measurement.
Abstract
Over the years, technology has become increasingly important for the study of management and organization, and its measurement has become a major point on the research agenda for many academics. In most empirical studies, scholars typically assume that technological domains are all equally distant (i.e., dissimilar) from one another. This is, however, a faulty assumption, as certain domains are more related (e.g., biotechnology and pharmaceuticals) than others (e.g., biotechnology and automotive). As we will demonstrate in this paper, this has important implications for the measurement of technological knowledge both within and across firms. By generalizing Jaffe’s (1986) measure of angular separation, we are able to show the existence of a severe bias in the traditional measurement of technological distance.
Keywords: Technology, technological knowledge, technological landscapes, technological domains, patent data, distance, measurement.
Practical information
- General public
- Free
Organizer
- Management of Technology & Entrepreneurship Institute