Silicon is ductile and thinner is stronger: recent insights from in-situ SEM, variable temperature nanomechanical testing

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Event details

Date 19.03.2013
Hour 13:1514:15
Speaker Dr. Johann Michler
Bio : Johann Michler is currently head of the Laboratory of Mechanics of Materials and Nanostructures at EMPA in Thun. He studied Materials Science and received a PhD degree at EPFL in 2000. After his PhD he started at EMPA his activities as group leader. His current research interest focuses on scale dependent mechanical properties of materials. He is the author or co-author of more than 200 research papers in peer-reviewed international journals and cofounded 2 spin-off
companies.
Location
Category Conferences - Seminars
Abstract : The creation of miniaturized mechanical structures and devices calls for an understanding of the mechanical properties of the semiconductor and metallic materials used at these small length scales. Investigation of different types of loading, such as compression or bending, requires the development of appropriate miniaturized instrumentation and integration into different micro-analysis instruments (SEM, optical probes etc.) allowing for in-situ microstructure analysis. The talk will illustrate different materials case studies using in-situ nanomechanical testing: sample size and temperature dependent brittle to ductile transitions in semiconductors, shear band formation in amorphous metals, displacement bursts and thinness effect in crystalline metals.

Practical information

  • General public
  • Free

Organizer

  • IGM

Contact

  • Géraldine Palaj

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