Course: Introduction to scanning electron microscopy microanalysis techniques
![Thumbnail](http://memento.epfl.ch/image/25100/1440x810.jpg)
Event details
Date | 29.11.2023 › 01.12.2023 |
Hour | 08:00 › 17:00 |
Speaker |
Dr. Xavier Maeder Prof. Johann Michler |
Category | Conferences - Seminars |
Event Language | English |
Modern Scanning Electron Microscopes, when combined with focused ion beams (Dual beam FIBs), provide a larger number of multi-modal imaging and different analytical methods. The course format consists of introductory lectures, lectures on advanced techniques and practical work. This course may be validated for 1 ECTS credit in the doctoral programs of EPFL and ETH Zurich, after acceptance by the corresponding institution. In this case, students will need to attend every lecture and pass a final written examination.
Topics
- Basics of the scanning electron microscopy and focused ion beam instruments (construction principles, signals, interaction with the sample)
- Advanced imaging modes: STEM, low tension microscopy, high vacuum, ion channeling
- Advanced microstructure investigation with EBSD and transmission EBSD orientation mapping (EBSD strain and stress analyses with cross correlation technique)
- Chemical analyses with EDS, WDS and μ-XRF
- Chemical depth profile with FIB-TOF-SIMS
- Raman spectrometry for phase and strain/stress analyses
Practical information
- Informed public
- Registration required
Organizer
- Empa Thun