Exploring materials in 3D down to the atomic scale
Event details
| Date | 28.06.2012 |
| Hour | 16:30 › 19:00 |
| Speaker |
Cécile Hébert - EPFL Ivo Utke - Empa Rolf Erni - Empa Anders Meibom - EPFL Roger Wepf - ETH Zurich Marco Cantoni and Duncan Alexander - EPFL |
| Location |
Kursaal, Bern
|
| Category | Conferences - Seminars |
Exploring materials in 3D down to the atomic scale
Technology Aperitifs are "end of afternoon" networking events that aim to:
We are delighted to invite you to our next technology aperitif, which will provide an ideal opportunity for you to learn more about some of the latest developments in the field of materials characterization. Speakers from EPFL, Empa and ETH Zurich will present new techniques and possibilities that have become available thanks to recent progress in technology and instrumentation.
New electron optics have improved the resolution of electron microscopes into the sub-Angstrom range. New types of detectors (electron, x-ray and light) allow the exploration of different interactions of an electron beam with matter in an unprecedented way in both two and three dimensions. Ion beams focused and scanned in a similar way as electron beams can be used not only to micro-(nano-)machine a sample, but also to produce a stream of particles and molecules which reveals the composition with a high sensitivity. At its extreme the sample becomes the emitter and optics itself: the atom-probe allows the decomposition and analysis of the sample atom by atom.
These new techniques and some application examples will be presented during this event. After the presentations, you will have the opportunity to network with people from several CCMX technology platforms.
We look forward to seeing you in Bern on 28 June 2012.
Prof. Cécile Hébert
EPFL – Interdisciplinary Centre for Electron Microscopy
Technology Aperitifs are "end of afternoon" networking events that aim to:
- Provide information on hot materials science related topics in industry’s fields of interests
- Stimulate creativity for future applications
- Create contacts for potential partnerships
- Provide a pleasant networking environment
We are delighted to invite you to our next technology aperitif, which will provide an ideal opportunity for you to learn more about some of the latest developments in the field of materials characterization. Speakers from EPFL, Empa and ETH Zurich will present new techniques and possibilities that have become available thanks to recent progress in technology and instrumentation.
New electron optics have improved the resolution of electron microscopes into the sub-Angstrom range. New types of detectors (electron, x-ray and light) allow the exploration of different interactions of an electron beam with matter in an unprecedented way in both two and three dimensions. Ion beams focused and scanned in a similar way as electron beams can be used not only to micro-(nano-)machine a sample, but also to produce a stream of particles and molecules which reveals the composition with a high sensitivity. At its extreme the sample becomes the emitter and optics itself: the atom-probe allows the decomposition and analysis of the sample atom by atom.
These new techniques and some application examples will be presented during this event. After the presentations, you will have the opportunity to network with people from several CCMX technology platforms.
We look forward to seeing you in Bern on 28 June 2012.
Prof. Cécile Hébert
EPFL – Interdisciplinary Centre for Electron Microscopy
Practical information
- Informed public
- Registration required