From Microstructure to Macro Properties by Different Microscopy Techniques
Event details
| Date | 06.10.2009 |
| Hour | 11:00 |
| Speaker | Dr. Massoud Dadras |
| Location |
EPFL - IMT-NE, Breguet 2, Neuchâtel Salle MT2 / 11h00
|
| Category | Conferences - Seminars |
Microstructure is defined as the structure of materials above a microscopic scale. For example in the case of crystalline materials, the microstructure concerns the crystal grains and defects (volume defects such as voids and precipitates, surface defects such as grain boundaries and interfaces, linear defects such as dislocations and point defects such as vacancies).
The influence of microstructure on the properties has been largely studied and different functions have been proposed to explain the relation between the interaction of dislocation and defects on the bulk properties of materials, some examples are: a) the Hall-Petch equation for influence of grain size on yield strength, b) Orowan equation explaining the influence of the presence of precipitate and its size and distribution on the mechanical properties and c) the relation between the density of defects and the electrical conductivity.
The electron microscopes, having mainly better resolution in comparison with other observing techniques, were used to study the microstructure since 50ies and largely contributed to explaining the macro-properties.
Different microscopy techniques are available in the facilities in Neuchâtel such as Transmission Electron Microscope (TEM), Environmental Scanning Electron Microscope (ESEM), Cryo-SEM, EBIC, EBSD, Scanning Probe Microscope and Confocal Microscope.
The importance of microstructural studies by different microscopy techniques for explaining the properties will be presented through some examples.
Links
Practical information
- General public
- Free
Contact
- M.-Cl. Gauteaub