Imaging Seminar: Synchrotron X-ray Nano-Tomography from 3D Imaging to 4D Characterization

Nano-scale characterization is essential for understanding microstructures and their role in material properties, evolution, and degradation. Synchrotron X-ray nano-tomography offers a powerful approach for three-dimensional investigation at the nanoscale. With the advent of fourth-generationsynchrotron sources, these capabilities can be further extended from 3D to 4D imaging, opening the way to the study of dynamic processes and in situ experiments.

This seminar will present the 3D nano-imaging capabilities of beamline ID16B at the ESRF, with examples of multi-scale and dynamic experiments. Practical aspects of data acquisition, processing, and image analysis will be addressed, highlighting common challenges and strategies to overcome them. Finally, the potential for combining synchrotron X-ray nano tomography with other imaging techniques, including scanning methods such as X-ray fluorescence (XRF), will be discussed, highlighting both the complementary insights they provide into material structure, composition, and dynamics, as well as the specific challenges associated with acquiring and analysing such datasets.

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