Master Thesis Presentation - Characterization of Flat-Fielding Systems for Super-Resolution Microscopy
The laser beams used at the heart of many microscopy techniques have Gaussian profiles — with the beam intensity peaking at the center and decaying radially. In super-resolution microscopy, this fact leads to a varying, field-dependent image quality. Several flat-fielding mechanisms exist to tackle this issue, including field-mapping and beam-integration methods. Such techniques transform an input Gaussian profile into a uniform one, reducing the variations in image quality. In this master's project, beam shaping systems of both kinds are characterized experimentally to find out which method is more suitable for wide-field illumination and multipoint-scanning illumination.