The SICLOP detector: a novel imaging method in scanning electron microscopy

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Event details

Date 02.06.2016
Hour 14:3015:30
Speaker Jean-Claude Menard, Electron Microscopist, Founder of Ahead Microscopy
Location
Category Conferences - Seminars
Most modern digital imaging systems are based as a two dimensions matrix (the 2D image), where the picture element (i.e. the pixel) is defined as the quantum based unit from some thousands, millions or even billions that compose the watched scene.

In a Scaning Electron Microscope (SEM), by impinging the sample with a controlled electron beam, can handle multiple progressive and continuous magnifications from the visible scale to nanoscale (some 10-9 meters) offering huge capabilities in providing information in both life and material sciences. The SEM electron beam to sample interactions provides a universe of re-emissions composed by electon species that handle sample information in deeper scales. Most of them have been described and classified in details with single techniques using various and dedicated 0D detectors.

The new SICLOP (Spacial Imaging Control in Live Operation) detector is, by its concept imported from a supposed or admitted human vision strategy: fed with predictable patterns and uploaded from a optronic calculator. Finally, its output signal is still dimensionless, but resluting from a direct correlated and coheret calculation between the patterns and the watched scene.

From various examples in SEM wlctron detection, the SICLOP concept will be presented and discussed as a possbile efficient human like imaging device.

Practical information

  • General public
  • Free

Organizer

  • Henry Markram, Laboratory of Neural Microcircuitry/LNMC, Brain Mind Institute, Faculty of Life Sciences

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