Understanding Specifics of the Wafer-level S-parameter System Calibration
Event details
| Date | 25.06.2014 |
| Hour | 14:00 › 15:00 |
| Speaker |
Andrej Rumiantsev, Electrical Engineering, Brandenburg University of Technology BTU Cottbus, Germany Bio: Andrej Rumiantsev was born in Minsk, Belarus in 1972. He received the Diploma-Engineer degree (with highest honors) in Telecommunication systems from the Belarusian State University of Informatics and Radio Electronics (BSUIR), Minsk, Belarus, and the Dr.-Ing. Degree (with summa cum laude) in Electrical Engineering from Brandenburg University of Technology (BTU) Cottbus, Germany, in 1994 and 2014, respectively. From 1997 to 2001, he was a research and teaching assistant in the Department of Telecommunication Systems at the BSUIR. From 2001 to 2013, he has been employed at SUSS MicroTec Test Systems (from January 2010 Cascade Microtech) at various engineering and engineering management positions. He significantly contributed to the development of the SUSS’ RF wafer probe, the |Z| Probe, wafer-level calibration standards, calibration software and probe systems. At Cascade Microtech, he held the position of Product Marketing Manager of Device Characterization for Modeling and Process Development. From March 2013, he is with Ulrich L. Rohde Chair for RF and Microwave Techniques at Brandenburg University of Technologies (BTU), Cottbus, Germany. His research interests include RF calibration and wafer-level measurement techniques for advanced semiconductor devices. Dr. Rumiantsev is a member of the IEEE MTT-S, ARFTG from 2004 as well as the IEEE MTT-11 Microwave Measurements Committee. He serves as the Chair of the Modeling and Simulation Sub-Committee of IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM). He is an active publishing author and reviewer at various MTT-S conferences and journals. He holds several patents in the area of wafer-level RF calibration and measurements techniques. Dr. Rumiantsev received the ARFTG-71th Best Interactive Forum Paper Award. |
| Location | |
| Category | Conferences - Seminars |
A quick guide on how to achieve accurate and confident measurement results of planar devices at the mm-wave frequency range and beyond.
Wafer-level S-parameter measurement at mm-wave and sub-mm wave frequencies plays a crucial role in the model development and IC design verification and debug of advanced semiconductor technologies. Accurate calibration of the entire wafer-level measurement system to the RF probe tip end or to the intrinsic device terminals is a critical success factor for extracting trustable device model parameters and characterizing true performance of a RF IC.
Nowadays, various RF calibration methods are available and used at the wafer-level. This talk will start with exploring the basics of the S-parameter calibration techniques. Special attention will be given to the generalised calibration theory as well as to choosing the right calibration method for specific measurement application needs. Definition of the calibration reference plane and the measurement reference impedance of a calibrated system will be reviewed as well. Finally, the potential sources of calibration residua errors will be analyzed and some practical examples will be given on how to minimize the impact of such errors on the measurement accuracy of a calibrated probe system.
Wafer-level S-parameter measurement at mm-wave and sub-mm wave frequencies plays a crucial role in the model development and IC design verification and debug of advanced semiconductor technologies. Accurate calibration of the entire wafer-level measurement system to the RF probe tip end or to the intrinsic device terminals is a critical success factor for extracting trustable device model parameters and characterizing true performance of a RF IC.
Nowadays, various RF calibration methods are available and used at the wafer-level. This talk will start with exploring the basics of the S-parameter calibration techniques. Special attention will be given to the generalised calibration theory as well as to choosing the right calibration method for specific measurement application needs. Definition of the calibration reference plane and the measurement reference impedance of a calibrated system will be reviewed as well. Finally, the potential sources of calibration residua errors will be analyzed and some practical examples will be given on how to minimize the impact of such errors on the measurement accuracy of a calibrated probe system.
Practical information
- General public
- Free
Organizer
- Characterization Platform CARPLAT