Atomic-scale Characterization of Strain and Gate effects on Two-dimensional Materials by Scanning Tunneling Microscopy
Event details
| Date | 11.09.2023 |
| Hour | 16:45 |
| Speaker | Jz -Yuan JUO |
| Location |
Max Planck Institute, Lecture Hall 2D5, Heisenbergstr. 1., D-70569 Stuttgart
Online
|
| Category | Thesis defenses |
Thesis Director: Prof. K. Kern,
Physics doctoral program
Thesis Nr. 10592
To take part in the public defense, please contact directly the speaker
Practical information
- General public
- Free
Contact
- Jz -Yuan JUO