Electron Microscopy Imaging of Highly Sensitive Crystalline Chemical Materials
Event details
| Date | 10.12.2025 |
| Hour | 10:00 › 11:00 |
| Speaker | Prof. Yu Han | Center for Electron Microscopy, South China University of Technology |
| Location | Online |
| Category | Conferences - Seminars |
| Event Language | English |
This presentation will focus on our recent works pertaining to the high-resolution imaging of electron beam-sensitive materials using ultralow electron doses. The following technological advances will be discussed. First, the development of a suite of methods to address the challenges peculiar to low-dose TEM imaging, including rapid search for crystal zone axes, precise alignment of the image stack, and accurate determination of the defocus value, enables efficient imaging of electron beam-sensitive crystalline materials in the high-resolution TEM (HRTEM) mode [1-3]. Second, integrated differential phase contrast STEM (iDPC-STEM) has proven to be an effective method for acquiring directly interpretable atomic-resolution images under low-dose conditions [4]. Third, I will share my views on the great potential of four-dimensional STEM (4D-STEM) electron ptychography in imaging highly electron beam-sensitive materials and provide preliminary results to demonstrate its feasibility [5-6].
References
[1] Unravelling surface and interfacial structures of a metal-organic framework by transmission electron microscopy. Nat. Mater.2017, 16, 532-536.
[2] Atomic-resolution transmission electron microscopy of electron beam-sensitive crystalline materials. Science 2018, 359, 675-679.
[3] Imaging defects and their evolution in a metal-organic framework at sub-unit-cell resolution. Nat. Chem. 2019, 11, 622-628.
[4] Direct Imaging of Atomically Dispersed Molybdenum that Enables Location of Aluminum in the Framework of Zeolite ZSM-5, Angew. Chem. Int. Ed., 2020, 59, 819-825
[5] Three-dimensional inhomogeneity of zeolite structure and composition revealed by electron ptychography. Science 2023, 380, 633-638.
[6] Atomically resolved imaging of radiation-sensitive metal-organic frameworks via electron ptychography. Nat. Commun. 2025, 16, 914.
Biography
Dr. Yu Han obtained his PhD from Jilin University in 2003 and served as a research scientist at A-Star in Singapore from 2003 to 2008. Between 2009 and 2023, he worked at King Abdullah University of Science and Technology in Saudi Arabia as a professor in the Department of Chemistry and Chemical Engineering. In September 2023, he joined South China University of Technology as the Director of the Center for Electron Microscopy.
Dr. Han was recognized as one of the top 100 young inventors by MIT's Technology Review magazine in 2004, received the Young Scientist Award in Singapore in 2006, the Thomson Reuters Research Fronts Award in 2008, was named a Chang Jiang Scholar Lecture Professor by the Ministry of Education of China in 2016, received the Humboldt Research Award in 2021, and was a Clarivate Analytics Highly Cited Researcher for five consecutive years from 2019 to 2024.
Practical information
- General public
- Free
- This event is internal
Organizer
- CIME